Influence of silver migration on dielectric properties and reliability of relaxor based MLCCs

Ceramics International

Volumn 26, Issue 6, 2000, Pages 673-676

  Zuo, Ruzhong ^a   Li, Longtu ^a   Gui, Zhilun ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITE MICROMECHANICS; DOPING (ADDITIVES); ELECTRODES; FERROELECTRIC MATERIALS; GRAIN GROWTH; INTERFACES (MATERIALS); MICROSTRUCTURE; MULTILAYERS; SILVER;

MULTILAYER CERAMIC CAPACITORS;

CERAMIC CAPACITORS;

EID: 0033727136     PISSN: 02728842     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0272-8842(00)00003-1     Document Type: Article

References (10)

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9. 3 relaxor dielectric ceramics J. Am. Ceram. Soc. 76(2):1993;459-464.
10. Hwang H.J., Nagai T., Ohji T., Sando M. Curie temperature anomaly in lead zirconate titanate/silver composites. J. Am. Ceram. Soc. 81(3):1998;709-712.