TEM and EDS investigation of heterogeneous interfaces in cofired multilayer ceramic capacitors

Materials Science and Engineering: B

Volumn 95, Issue 1, 2002, Pages 1-5

  Zuo, Ruzhong ^a,c   Li, Longtu ^a   Gui, Zhilun ^a   Hung, Takfu ^b   Xu, Zhengkui ^b  

^a TSINGHUA UNIVERSITY   (China)

^b CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^c DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Cofiring; EDS; Interdiffusion; Interface; TEM

Indexed keywords

CERAMIC CAPACITORS; ELECTRODES; ENERGY DISPERSIVE SPECTROSCOPY; INTERFACES (MATERIALS); MICROSTRUCTURE; MULTILAYERS; TRANSMISSION ELECTRON MICROSCOPY;

COFIRED MULTILAYERS; HETEROGENEOUS INTERFACES;

FERROELECTRIC CERAMICS;

EID: 0036641475     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(02)00094-6     Document Type: Article

References (12)