Nanoscale structural and mechanical characterization of bamboo-like polymer/silicon nanocomposite films

Nanotechnology

Volumn 16, Issue 9, 2005, Pages 1746-1753

  Ni, Hai ^a   Li, Xiaodong ^a   Gao, Hongsheng ^a   Nguyen, Thien Phap ^b  

^a University of South Carolina   (United States)

^b INSTITUT DES MATÉRIAUX JEAN ROUXEL   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; NANOSTRUCTURED MATERIALS; ORGANIC POLYMERS; SILICON; SYNTHESIS (CHEMICAL);

NANOCOMPOSITE FILMS; NANOCOMPOSITE STRUCTURE; NANOSCRATCH RESISTANCE; SILICON NANOCOMPOSITES;

THIN FILMS;

EID: 23444453031     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/9/056     Document Type: Review

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