SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Microelectronic Engineering

Volumn 81, Issue 2-4, 2005, Pages 222-228

Charge injection spectroscopy of Alq3 thin films deposited on bare and LiF-modified metal substrates

(3) Anazawa, Toshihisa a Tsukada, Mineharu a Kataoka, Yuji a

a FUJITSU LABORATORIES LTD (Japan)

Author keywords

Alq3; Charge injection; LiF; Organic metal interface; Scanning tunneling microscope

Indexed keywords

ALUMINUM COMPOUNDS; DEPOSITION; ELECTRON TRANSITIONS; LIGHT EMITTING DIODES; LITHIUM COMPOUNDS; POLARONS; SCANNING TUNNELING MICROSCOPY; SUBSTRATES;

ALQ3; CHARGE INJECTION; LIF; ORGANIC/METAL INTERFACES;

THIN FILMS;

EID: 23444433954 PISSN: 01679317 EISSN: None Source Type: Journal
DOI: 10.1016/j.mee.2005.03.011 Document Type: Conference Paper

Times cited : (10)

References (27)

1
- 21544459113
- C.W. Tang, and S.A. VanSlyke Appl. Phys. Lett. 51 1987 913
- (1987) Appl. Phys. Lett. , vol.51 , pp. 913
- Tang, C.W.¹ Vanslyke, S.A.²

2
- 2942620527
- H. Ishii, N. Hayashi, E. Ito, Y. Washizu, K. Sugi, Y. Kimura, M. Niwano, Y. Ouchi, and K. Seki Phys. Stat. Sol. (a) 201 2004 1075
- (2004) Phys. Stat. Sol. (A) , vol.201 , pp. 1075
- Ishii, H.¹ Hayashi, N.² Ito, E.³ Washizu, Y.⁴ Sugi, K.⁵ Kimura, Y.⁶ Niwano, M.⁷ Ouchi, Y.⁸ Seki, K.⁹

3
- 0011336568
- H. Ishii, K. Sugiyama, E. Ito, and K. Seki Adv. Mater. 11 1999 605
- (1999) Adv. Mater. , vol.11 , pp. 605
- Ishii, H.¹ Sugiyama, K.² Ito, E.³ Seki, K.⁴

4
- 0037599324
- J. Campbell Scott J. Vac. Sci. Technol. A 21 2003 521
- (2003) J. Vac. Sci. Technol. A , vol.21 , pp. 521
- Campbell Scott, J.¹

5
- 0242386370
- A. Kahn, N. Koch, and W. Gao J. Polym. Sci. B 41 2003 2529
- (2003) J. Polym. Sci. B , vol.41 , pp. 2529
- Kahn, A.¹ Koch, N.² Gao, W.³

6
- 2942609178
- X. Crispin Sol. Energy Mater. Sol. Cells 83 2004 147
- (2004) Sol. Energy Mater. Sol. Cells , vol.83 , pp. 147
- Crispin, X.¹

7
- 2942558844
- M. Knupfer, and H. Peisert Phys. Stat. Sol. (a) 201 2004 1055
- (2004) Phys. Stat. Sol. (A) , vol.201 , pp. 1055
- Knupfer, M.¹ Peisert, H.²

8
- 4143129928
- W.R. Salaneck, and M. Fahlman J. Mater. Res. 19 2004 1917
- (2004) J. Mater. Res. , vol.19 , pp. 1917
- Salaneck, W.R.¹ Fahlman, M.²

9
- 0000123953
- S.F. Alvarado, P.F. Seidler, D.G. Lidzey, and D.D.C. Bradley Phys. Rev. Lett. 81 1998 1082
- (1998) Phys. Rev. Lett. , vol.81 , pp. 1082
- Alvarado, S.F.¹ Seidler, P.F.² Lidzey, D.G.³ Bradley, D.D.C.⁴

10
- 0035026533
- S.F. Alvarado, L. Rossi, P. Müller, P.F. Seidler, and W. Riess IBM J. Res. Dev. 45 2001 89
- (2001) IBM J. Res. Dev. , vol.45 , pp. 89
- Alvarado, S.F.¹ Rossi, L.² Müller, P.³ Seidler, P.F.⁴ Riess, W.⁵

11
- 0030834751
- L.S. Hung, C.W. Tang, and M.G. Mason Appl. Phys. Lett. 70 1997 152
- (1997) Appl. Phys. Lett. , vol.70 , pp. 152
- Hung, L.S.¹ Tang, C.W.² Mason, M.G.³

12
- 0004632758
- N. Shimizu, T. Kimura, T. Nakamura, and I. Umebu J. Vac. Sci. Technol. A 8 1990 333
- (1990) J. Vac. Sci. Technol. A , vol.8 , pp. 333
- Shimizu, N.¹ Kimura, T.² Nakamura, T.³ Umebu, I.⁴

13
- 0000091844
- A. Curioni, M. Boero, and W. Andreoni Chem. Phys. Lett. 294 1998 263
- (1998) Chem. Phys. Lett. , vol.294 , pp. 263
- Curioni, A.¹ Boero, M.² Andreoni, W.³

14
- 0001553754
- R.L. Martin, J.D. Kress, I.H. Campbell, and D.L. Smith Phys. Rev. B 61 2000 15804
- (2000) Phys. Rev. B , vol.61 , pp. 15804
- Martin, R.L.¹ Kress, J.D.² Campbell, I.H.³ Smith, D.L.⁴

15
- 0035894023
- M. Sugimoto, S. Sakaki, K. Sakanoue, and M.D. Newton J. Appl. Phys. 90 2001 6092
- (2001) J. Appl. Phys. , vol.90 , pp. 6092
- Sugimoto, M.¹ Sakaki, S.² Sakanoue, K.³ Newton, M.D.⁴

16
- 0000386610
- A. Curioni, W. Andreoni, R. Treusch, F.J. Himpsel, E. Haskal, P. Seidler, C. Heske, S. Kakar, T. von Buuren, and L.J. Terminello Appl. Phys. Lett. 72 1998 1575
- (1998) Appl. Phys. Lett. , vol.72 , pp. 1575
- Curioni, A.¹ Andreoni, W.² Treusch, R.³ Himpsel, F.J.⁴ Haskal, E.⁵ Seidler, P.⁶ Heske, C.⁷ Kakar, S.⁸ Von Buuren, T.⁹ Terminello, L.J.¹⁰

17
- 0001174145
- I.G. Hill, A. Kahn, Z.G. Soos, and R.A. Pascal Jr. Chem. Phys. Lett. 327 2000 181
- (2000) Chem. Phys. Lett. , vol.327 , pp. 181
- Hill, I.G.¹ Kahn, A.² Soos, Z.G.³ Pascal Jr., R.A.⁴

18
- 0000667766
- I. Lindau, and W.E. Spicer J. Electron. Spec. Relat. Phenom. 3 1974 409
- (1974) J. Electron. Spec. Relat. Phenom. , vol.3 , pp. 409
- Lindau, I.¹ Spicer, W.E.²

19
- 0037014783
- E.V. Tsiper, Z.G. Soos, W. Gao, and A. Kahn Chem. Phys. Lett. 360 2002 47
- (2002) Chem. Phys. Lett. , vol.360 , pp. 47
- Tsiper, E.V.¹ Soos, Z.G.² Gao, W.³ Kahn, A.⁴

20
- 0035881153
- M.A. Baldo, and S.R. Forrest Phys. Rev. B 64 2001 085201
- (2001) Phys. Rev. B , vol.64 , pp. 085201
- Baldo, M.A.¹ Forrest, S.R.²

21
- 0001102033
- I.G. Hill, A.J. Mäkinen, and Z.H. Kafafi Appl. Phys. Lett. 77 2000 1825
- (2000) Appl. Phys. Lett. , vol.77 , pp. 1825
- Hill, I.G.¹ Mäkinen, A.J.² Kafafi, Z.H.³

22
- 0041880346
- T. Yokoyama, D. Yoshimura, E. Ito, H. Ishii, Y. Ouchi, and K. Seki Jpn. J. Appl. Phys. 42 2003 3666
- (2003) Jpn. J. Appl. Phys. , vol.42 , pp. 3666
- Yokoyama, T.¹ Yoshimura, D.² Ito, E.³ Ishii, H.⁴ Ouchi, Y.⁵ Seki, K.⁶

23
- 0000009891
- Q.T. Le, L. Yan, Y. Gao, M.G. Mason, D.J. Giesen, and C.W. Tang J.Appl. Phys. 87 2000 375
- (2000) J.Appl. Phys. , vol.87 , pp. 375
- Le, Q.T.¹ Yan, L.² Gao, Y.³ Mason, M.G.⁴ Giesen, D.J.⁵ Tang, C.W.⁶

24
- 0036463056
- T. Yokoyama, H. Ishii, Y. Ouchi, D. Yoshimura, K. Seki, E. Ito, and H. Oji Surf. Rev. Lett. 9 2002 425
- (2002) Surf. Rev. Lett. , vol.9 , pp. 425
- Yokoyama, T.¹ Ishii, H.² Ouchi, Y.³ Yoshimura, D.⁴ Seki, K.⁵ Ito, E.⁶ Oji, H.⁷

25
- 0033699781
- S. Naka, H. Okada, H. Onnagawa, Y. Yamaguchi, and T. Tsutsui Synth. Met. 111-112 2000 331
- (2000) Synth. Met. , vol.111-112 , pp. 331
- Naka, S.¹ Okada, H.² Onnagawa, H.³ Yamaguchi, Y.⁴ Tsutsui, T.⁵

26
- 20144381496
- D. Ino, K. Watanabe, N. Takagi, and Y. Matsumoto Phys. Rev. B 71 2005 115427
- (2005) Phys. Rev. B , vol.71 , pp. 115427
- Ino, D.¹ Watanabe, K.² Takagi, N.³ Matsumoto, Y.⁴

27
- 0037080931
- M. Knupfer, H. Peisert, and T. Schwieger Phys. Rev. B 65 2002 033204
- (2002) Phys. Rev. B , vol.65 , pp. 033204
- Knupfer, M.¹ Peisert, H.² Schwieger, T.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.