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Volumn 218, Issue 1-4, 2004, Pages 375-380
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Mechanical properties of polyhedral oligomeric silsesquioxane (POSS) thin films submitted to Si irradiation
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Author keywords
Ion implantation; Mechanical properties; Nanoindentation; POSS
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Indexed keywords
ELASTIC MODULI;
FOURIER TRANSFORM INFRARED SPECTROSCOPY;
HARDNESS;
INDENTATION;
ION BOMBARDMENT;
ION IMPLANTATION;
PLASTIC FILMS;
RAMAN SPECTROSCOPY;
ELASTIC RECOIL DETECTION ANALYSIS;
NANOINDENTATION;
POSS;
THIN FILMS;
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EID: 2342595191
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nimb.2004.01.011 Document Type: Conference Paper |
Times cited : (10)
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References (15)
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