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Volumn 218, Issue 1-4, 2004, Pages 375-380

Mechanical properties of polyhedral oligomeric silsesquioxane (POSS) thin films submitted to Si irradiation

Author keywords

Ion implantation; Mechanical properties; Nanoindentation; POSS

Indexed keywords

ELASTIC MODULI; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HARDNESS; INDENTATION; ION BOMBARDMENT; ION IMPLANTATION; PLASTIC FILMS; RAMAN SPECTROSCOPY;

EID: 2342595191     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2004.01.011     Document Type: Conference Paper
Times cited : (10)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.