Nanoscratch testing of C60 thin films irradiated with N ions

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 175-177, Issue , 2001, Pages 673-677

  Lopes, J M J ^a   Foerster, C E ^a   Serbena, F C ^a   Lepienski, C M ^b   Baptista, D L ^c   Zawislak, F C ^c  

^a STATE UNIVERSITY OF PONTA GROSSA   (Brazil)

^b FEDERAL UNIVERSITY OF PARANÁ   (Brazil)

^c FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

Amorphization; Friction coefficient; Fullerene; Ion irradiation

Indexed keywords

AMORPHIZATION; FRICTION; FULLERENES; INTERFACES (MATERIALS); ION BOMBARDMENT; OPTICAL CORRELATION; THIN FILMS;

NANOINDENTATION; NANOSCRATCH TESTING;

PROTECTIVE COATINGS;

EID: 0035302965     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(00)00556-5     Document Type: Conference Paper

References (8)