Characterization of magnetic Czochralski silicon radiation detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 548, Issue 3, 2005, Pages 355-363

  Pellegrini, G ^a   Rafi J M ^a   Ullan M ^a   Lozano, M ^a   Fleta, C ^a   Campabadal, F ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE BARCELONA   (Spain)

Author keywords

Magnetic Czochralski; Radiation hardness; Silicon pad

Indexed keywords

CARBON; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; LEAKAGE CURRENTS; MAGNETIC MATERIALS; OXYGEN; RADIATION HARDENING; SILICON WAFERS;

MAGNETIC CZOCHRALSKI; PHOTOCONDUCTANCE; RADIATION HARDNESS; SILICON PADS;

RADIATION DETECTORS;

EID: 23344441351     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.05.001     Document Type: Article

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