메뉴 건너뛰기




Volumn 43, Issue 2, 2000, Pages 139-150

Metastable and bistable defects in silicon

Author keywords

[No Author keywords available]

Indexed keywords


EID: 23044521296     PISSN: 10637869     EISSN: None     Source Type: Journal    
DOI: 10.1070/PU2000v043n02ABEH000649     Document Type: Review
Times cited : (29)

References (120)
  • 2
    • 22944490128 scopus 로고
    • [Sov. Phys. Usp. 7 797 (1965)]
    • (1965) Sov. Phys. Usp. , vol.7 , pp. 797
  • 4
    • 0004101812 scopus 로고
    • Point Defects in Semiconductors II Experimental Aspects
    • Berlin: Springer-Verlag, Translated into Russian Moscow: Mir
    • Bourgoin J, Lanno M Point Defects in Semiconductors II Experimental Aspects (Springer Series in Solid-State Sciences, Vol. 35) (Berlin: Springer-Verlag, 1983) [Translated into Russian (Moscow: Mir, 1985)]
    • (1983) Springer Series in Solid-State Sciences , vol.35
    • Bourgoin, J.1    Lanno, M.2
  • 7
    • 52849134903 scopus 로고
    • Defects in Electronic Materials Eds M Stavola, S J Pearton, G Davies Pittsburgh, Pa.: Materials Research Society, Ch. 7
    • Chantre A, in Defects in Electronic Materials (Mater. Res. Soc. Symp. Proc., Vol. 104, Eds M Stavola, S J Pearton, G Davies) (Pittsburgh, Pa.: Materials Research Society, 1988) Ch. 7
    • (1988) Mater. Res. Soc. Symp. Proc. , vol.104
    • Chantre, A.1
  • 9
    • 0004265644 scopus 로고
    • New York: Benjamin, Translated into Russian Moscow: Nauka
    • Schrieffer J R Theory of Superconductivity (New York: Benjamin, 1964) [Translated into Russian (Moscow: Nauka, 1970)]
    • (1964) Theory of Superconductivity
    • Schrieffer, J.R.1
  • 13
    • 79952650584 scopus 로고
    • [Semicond. 29 169 (1995)]
    • (1995) Semicond. , vol.29 , pp. 169
  • 43
    • 21844486009 scopus 로고
    • [Semicond. 28 1012 (1994)]
    • (1994) Semicond. , vol.28 , pp. 1012
  • 53
    • 52849086092 scopus 로고    scopus 로고
    • [Semicond. 32 375 (1998)]
    • (1998) Semicond. , vol.32 , pp. 375
  • 56
    • 52849118918 scopus 로고    scopus 로고
    • [Semicond. 32 457 (1998)]
    • (1998) Semicond. , vol.32 , pp. 457
  • 57
    • 0041478965 scopus 로고
    • (Eds R B Fair, C W Pearce, J Washburn) Pittsburgh, Pa.: Materials Research Society
    • Weber E R, in Impurity Diffusion and Gettering in Silicon (Eds R B Fair, C W Pearce, J Washburn) (Pittsburgh, Pa.: Materials Research Society, 1985)
    • (1985) Impurity Diffusion and Gettering in Silicon
    • Weber, E.R.1
  • 80
    • 52849137876 scopus 로고    scopus 로고
    • Author's abstract of Ph.D. dissertation Almaty: The Institute of Physics and Technology
    • Tokmoldin S Zh, Author's abstract of Ph.D. dissertation (Almaty: The Institute of Physics and Technology, 1998)
    • (1998)
    • Tokmoldin, S.Zh.1
  • 86
    • 0004019068 scopus 로고    scopus 로고
    • NATO ASI Series, Partnership Sub-Series 3, High Technology, Ed. R Jones Dordrecht: Kluwer Acad. Publ.
    • Early Stages of Oxygen Precipitation in Silicon (NATO ASI Series, Partnership Sub-Series 3, High Technology, Vol. 17, Ed. R Jones) (Dordrecht: Kluwer Acad. Publ., 1996)
    • (1996) Early Stages of Oxygen Precipitation in Silicon , vol.17
  • 102
    • 52849120854 scopus 로고
    • [Semicond. 28 806 (1994)]
    • (1994) Semicond. , vol.28 , pp. 806
  • 119
    • 52849087567 scopus 로고    scopus 로고
    • [Semicond. 32 488 (1998)]
    • (1998) Semicond. , vol.32 , pp. 488


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.