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Volumn 41, Issue 13, 2005, Pages 735-736

Connected box-units-based compact highly clean environment for cross-disciplinary experiments platform

Author keywords

[No Author keywords available]

Indexed keywords

BIOTECHNOLOGY; BOUNDARY CONDITIONS; ENVIRONMENTAL ENGINEERING; ETCHING; FIELD EFFECT TRANSISTORS; NANOTECHNOLOGY; PHOTOLITHOGRAPHY; RECYCLING; SEMICONDUCTOR MATERIALS; SOLVENTS;

EID: 22944466091     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20051053     Document Type: Article
Times cited : (11)

References (6)
  • 1
    • 22944468737 scopus 로고    scopus 로고
    • Possibility of uniting bottom-up structures with top-down systems
    • Tainan, Taiwan
    • Ishibashi, A.: 'Possibility of uniting bottom-up structures with top-down systems'. Proc. Int. Symp. Nano Science and Technology, Tainan, Taiwan, 2004, pp. 44-45
    • (2004) Proc. Int. Symp. Nano Science and Technology , pp. 44-45
    • Ishibashi, A.1
  • 2
    • 6444231056 scopus 로고    scopus 로고
    • Current-injection induced dislocation networks in II-VI laser diodes: Bottom-up structures emerging in top-down systems
    • Ishibashi, A., and Kondo, K.: 'Current-injection induced dislocation networks in II-VI laser diodes: bottom-up structures emerging in top-down systems', Electron. Lett., 2004, 40, pp. 1268-1269
    • (2004) Electron. Lett. , vol.40 , pp. 1268-1269
    • Ishibashi, A.1    Kondo, K.2
  • 3
    • 0344896827 scopus 로고    scopus 로고
    • Experimental study of airflow and particle characteristics of a 300-mm POUP/LPU minienvironment system
    • Hu, S.C., and Wu, T.M.: 'Experimental study of airflow and particle characteristics of a 300-mm POUP/LPU minienvironment system', IEEE Trans. Semicond. Manuf., 2003, 16, pp. 660-667
    • (2003) IEEE Trans. Semicond. Manuf. , vol.16 , pp. 660-667
    • Hu, S.C.1    Wu, T.M.2
  • 4
    • 0033100464 scopus 로고    scopus 로고
    • The characterization of a clean room assembly process
    • Mrad, F.: 'The characterization of a clean room assembly process', IEEE Trans. Ind. Appl., 1999, 35, pp. 399-404
    • (1999) IEEE Trans. Ind. Appl. , vol.35 , pp. 399-404
    • Mrad, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.