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Volumn 40, Issue 20, 2004, Pages 1268-1269

Current-injection induced dislocation networks in II-VI laser diodes: Bottom-up structures emerging in top-down system

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; INFORMATION TECHNOLOGY; MELTING; NANOTECHNOLOGY; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

EID: 6444231056     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20046226     Document Type: Article
Times cited : (7)

References (8)
  • 4
    • 0020088411 scopus 로고
    • Device degradation and recombination enhanced defect processes in III-V semiconductors
    • Petroff, P.: 'Device degradation and recombination enhanced defect processes in III-V semiconductors', Semicond. Insul., 1983, 5, pp. 307-319
    • (1983) Semicond. Insul. , vol.5 , pp. 307-319
    • Petroff, P.1
  • 5
    • 21544462660 scopus 로고
    • Degradation of II-VI based blue-green light emitters
    • Guha, S., DePuydt, J.M., Haase, M.A., Qiu, J., and Cheng, H.: 'Degradation of II-VI based blue-green light emitters', Appl. Phys. Lett., 1993, 63, pp. 3107-3109
    • (1993) Appl. Phys. Lett. , vol.63 , pp. 3107-3109
    • Guha, S.1    Depuydt, J.M.2    Haase, M.A.3    Qiu, J.4    Cheng, H.5
  • 6
    • 0029637495 scopus 로고
    • Structural study of defects induced during current injection to II-VI blue light emitter
    • Tomiya, S., Morita, E., Ukita, M., Okuyama, H., Itoh, S., Nakano, K., and Ishibashi, A.: 'Structural study of defects induced during current injection to II-VI blue light emitter', Appl. Phys. Lett., 1994, 66, pp. 1208-1210
    • (1994) Appl. Phys. Lett. , vol.66 , pp. 1208-1210
    • Tomiya, S.1    Morita, E.2    Ukita, M.3    Okuyama, H.4    Itoh, S.5    Nakano, K.6    Ishibashi, A.7
  • 7
    • 5844290410 scopus 로고
    • Self-organized criticality: An explanation of 1/f noise
    • Bak, P., Tang, C., and Wiesenfeld, K.: 'Self-organized criticality: an explanation of 1/f noise', Phys. Rev. Lett., 1987, 59, pp. 381-384
    • (1987) Phys. Rev. Lett. , vol.59 , pp. 381-384
    • Bak, P.1    Tang, C.2    Wiesenfeld, K.3
  • 8
    • 0001242261 scopus 로고    scopus 로고
    • Electric-field-induced diffusion-limited aggregation
    • Wen, W., and Lu, K.: 'Electric-field-induced diffusion-limited aggregation', Phys. Rev. E, 1997, 55, pp. R2100-R2103
    • (1997) Phys. Rev. E , vol.55
    • Wen, W.1    Lu, K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.