Interface traps density of anodic porous alumina films of different thicknesses on Si

Journal of Physics: Conference Series

Volumn 10, Issue 1, 2005, Pages 222-225

  Theodoropoulou, M ^a   Karahaliou, P K ^a   Georga, S N ^a   Krontiras, C A ^a   Pisanias, M N ^a   Kokonou, M ^b   Nassiopoulou, A G ^b  

^a UNIVERSITY OF PATRAS   (Greece)

^b INSTITUTE OF MICROELECTRONICS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 22544463393     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/10/1/055     Document Type: Article

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