Structural characterisation of polycrystalline α,ω-dihexyl quaterthiophene thin films by transmission electron microscopy

Organic Electronics

Volumn 5, Issue 1-3, 2004, Pages 141-145

  Campione, M ^a   Borghesi, A ^a   Moret, M ^a   Sassella, A ^a   Lotz, B ^b   Thierry, A ^b  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b CNRS   (France)

Author keywords

Oligothiophenes; Organic molecular beam deposition; Structural characterisation; Thin film growth; Transmission electron microscopy

Indexed keywords

AMORPHOUS MATERIALS; FIELD EFFECT TRANSISTORS; LATTICE CONSTANTS; MOLECULAR BEAMS; OPTICAL PROPERTIES; POLYCRYSTALLINE MATERIALS; QUARTZ; THERMAL EFFECTS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; ULTRAHIGH VACUUM;

OLIGOTHIOPHENES; ORGANIC MOLECULAR BEAM DEPOSITION; STRUCTURAL CHARACTERIZATION; THIN FILM GROWTH;

PLASTIC FILMS;

EID: 2342579362     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2004.01.003     Document Type: Conference Paper

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