Determination of the crystalline x-axis of quartz by second-harmonic phase measurement

Journal of the Korean Physical Society

Volumn 46, Issue SUPPL. II, 2005, Pages

  Jeon, Yoonnam ^a   Min, Haesik ^a   Kim, Doseok ^a   Oh E, Masahito ^b  

^a Sogang University   (South Korea)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Interference; Phase measurement; Quartz; Second harmonic generation

Indexed keywords

EID: 22544437875     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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