Planar YBa2Cu3O7-δ ion damage Josephson junctions and arrays

IEEE Transactions on Applied Superconductivity

Volumn 15, Issue 2 PART I, 2005, Pages 241-244

  Cybart, Shane A ^a   Chen, Ke ^a   Dynes, R C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

Arrays; Ion damage; Josephson junctions; Standards; YBCO

Indexed keywords

ARRAYS; CRITICAL CURRENTS; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRON BEAM LITHOGRAPHY; JUNCTION GATE FIELD EFFECT TRANSISTORS; MICROWAVE DEVICES; OSCILLATORS (ELECTRONIC); STANDARDS; SUPERCONDUCTING MATERIALS; YTTRIUM BARIUM COPPER OXIDES;

ION DAMAGE; OXYGEN PLASMA; TERAHERTZ OSCILLATORS; YBCO;

JOSEPHSON JUNCTION DEVICES;

EID: 22044440604     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2005.849768     Document Type: Conference Paper

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