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Volumn 467-468, Issue PART II, 2001, Pages 925-928
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Interferometric techniques for characterization of coherence of high-energy synchrotron X-rays
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 21844453936
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-9002(01)00527-7 Document Type: Article |
Times cited : (4)
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References (14)
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