Mirror surface characterization by topography with coherent x-rays

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3113, Issue , 1997, Pages 476-483

  Souvorov, A ^a   Snigireva, I ^a   Snigirev, A ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Interference; Surface roughness; X ray mirror

Indexed keywords

POLISHING; SPECKLE; SURFACE ROUGHNESS; SYNCHROTRON RADIATION; X RAY OPTICS;

COHERENT X RAYS;

MIRRORS;

EID: 0031305226     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.278879     Document Type: Conference Paper

References (12)

1. Phase contrast microimaging by coherent high energy synchrotron radiation
2. On the possibilities of X-ray phase contrast imaging by coherent high energy synchrotron radiation
3. Phase-contrast microtomography with coherent high energy synchrotron X-rays
4. On the requirements to the instrumentation for the new generation of the synchrotron radiation sources. Beryllium windows
5. Metrology of reflection optics for synchrotron radiation
6. Specification of surface figure and finish in terms of system performance
7. Transfer function characterization of grazing incidence optical systems
8. Performance prediction of a Schwarzschild imaging microscope for soft X-ray applications
9. X-ray interferometry technique for mirror and multilayer characterization