On the threshold voltage of metal-oxide-semiconductor field-effect transistors

Solid-State Electronics

Volumn 49, Issue 7, 2005, Pages 1179-1184

  Shi, Xuejie ^a   Wong, Man ^a  

^a HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

Author keywords

Linear extrapolation; MOSFET; Surface potential pinning; Threshold voltage

Indexed keywords

COMPUTER SIMULATION; ELECTRIC CHARGE; EXTRAPOLATION; MATHEMATICAL MODELS; THICKNESS MEASUREMENT; THRESHOLD VOLTAGE;

BAND-BENDING; BOLTZMANN CONSTANT; LINEAR EXTRAPOLATION; SURFACE POTENTIAL PINNING;

MOSFET DEVICES;

EID: 21444435470     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sse.2005.04.010     Document Type: Article

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