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Volumn 42, Issue 9, 1998, Pages 1743-1746

An improved definition for modelling the threshold voltage of MOSFETs

Author keywords

[No Author keywords available]

Indexed keywords

SEMICONDUCTOR DEVICE MODELS; THRESHOLD VOLTAGE;

EID: 0032165018     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(98)00138-5     Document Type: Article
Times cited : (26)

References (13)
  • 5
    • 0023422261 scopus 로고
    • Modeling of transconductance degradation and extraction of threshold voltage in thin oxide MOSFETs
    • Wong, H. S., White, M. H., Krutsick, T. J. and Booth, R. V., Modeling of transconductance degradation and extraction of threshold voltage in thin oxide MOSFETs, Solid-State Electron., 1987, 30, 953-968.
    • (1987) Solid-State Electron. , vol.30 , pp. 953-968
    • Wong, H.S.1    White, M.H.2    Krutsick, T.J.3    Booth, R.V.4
  • 6
    • 0024143472 scopus 로고
    • Measurement of threshold voltage and channel length of submicron MOSFETs
    • Jain, S., Measurement of threshold voltage and channel length of submicron MOSFETs, IEE Proc. Cir. Dev. Sys., 1988, 135(I), 162-164.
    • (1988) IEE Proc. Cir. Dev. Sys. , vol.135 , Issue.1 , pp. 162-164
    • Jain, S.1
  • 7
    • 0026172789 scopus 로고
    • Physically-based method for measuring the threshold voltage of MOSFETs
    • Yan, Z. X. and Deen, M. J., Physically-based method for measuring the threshold voltage of MOSFETs, IEE Proc. Cir. Dev. Sys., 1991, 138, 351-357.
    • (1991) IEE Proc. Cir. Dev. Sys. , vol.138 , pp. 351-357
    • Yan, Z.X.1    Deen, M.J.2
  • 11
    • 0026852922 scopus 로고
    • Influence of high substrate doping levels on the threshold voltage and mobility of deep-submicron MOSFETs
    • Van Dort, M. J., Woerlee, P. H., Walker, A. J., Juffermans, C. A. H. and Lifka, H., Influence of high substrate doping levels on the threshold voltage and mobility of deep-submicron MOSFETs, IEEE Trans. Electron Dev., 1992, 39, 932.
    • (1992) IEEE Trans. Electron Dev. , vol.39 , pp. 932
    • Van Dort, M.J.1    Woerlee, P.H.2    Walker, A.J.3    Juffermans, C.A.H.4    Lifka, H.5
  • 12
    • 0011573122 scopus 로고
    • A general solution of the quantization in a semiconductor surface inversion layer in the electric quantum limit
    • Pals, J. A., A general solution of the quantization in a semiconductor surface inversion layer in the electric quantum limit, Phys. Lett., 1972, 39, 101.
    • (1972) Phys. Lett. , vol.39 , pp. 101
    • Pals, J.A.1
  • 13
    • 0005052530 scopus 로고    scopus 로고
    • Siborg Systems, Waterloo, Ont.
    • MICROTEC Manual. Siborg Systems, Waterloo, Ont., 1996.
    • (1996) MICROTEC Manual


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.