Correlation between the Indium Tin Oxide morphology and the performances of polymer light-emitting diodes

Thin Solid Films

Volumn 485, Issue 1-2, 2005, Pages 247-251

  Wantz, G ^a   Hirsch, L ^a   Huby, N ^a   Vignau, L ^a   Silvain, J F ^b   Barriere A S ^a   Parneix, J P ^a  

^a UNIVERSITÉ BORDEAUX 1   (France)

^b INST CHIM MATIERE COND BORDEAUX   (France)

Author keywords

Atomic force microscopy; Indium tin oxide; Polymer light emitting diode; Rutherford backscattering spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; LIGHT EMITTING DIODES; MORPHOLOGY; POLYSTYRENES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES; SURFACE ROUGHNESS; SURFACE TREATMENT;

INDIUM TIN OXIDE; POLYMER LIGHT EMITTING DIODES; RESIDUAL ROUGHNESS; SULFONATES;

INDIUM COMPOUNDS;

EID: 21344448149     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.03.022     Document Type: Article

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