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Volumn 38, Issue 12, 2005, Pages 1869-1874

Analytical electron microscopy of advanced multilayer structures for magnetic devices

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON MICROSCOPY; ELECTRONIC STRUCTURE; MAGNETIC DEVICES; MAGNETIC HYSTERESIS; MAGNETIC PROPERTIES; OXIDATION; SCANNING TUNNELING MICROSCOPY; TRANSPORT PROPERTIES;

EID: 21144437707     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/12/003     Document Type: Article
Times cited : (5)

References (21)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.