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Applied Physics Letters

Volumn 86, Issue 19, 2005, Pages 1-3

Study of orientation effect on nanoscale polarization in BaTi O3 thin films using piezoresponse force microscopy

(6) Kim, Il Doo a Avrahami, Ytshak a Tuller, Harry L a Park, Young Bae b Dicken, Matthew J b Atwater, Harry A b

a Massachusetts Institute of Technology Cambridge (United States)

b California Institute of Technology (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILM ORIENTATION; NANOSCALE POLARIZATION; PIEZORESPONSE FORCE MICROSCOPY (PFM); STRAIN LOOPS;

ATOMIC FORCE MICROSCOPY; BARIUM COMPOUNDS; PIEZOELECTRICITY; POLARIZATION; PULSED LASER DEPOSITION; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

THIN FILMS;

EID: 20844450997 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1923173 Document Type: Article

Times cited : (61)

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