Novel frictionless approach mechanism for a scanning tunneling microscope

Review of Scientific Instruments

Volumn 74, Issue 10, 2003, Pages 4384-4388

  Guha, A ^a   Kim, S ^a   De Lozanne, A L ^a  

^a UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FRICTION; PRECISION ENGINEERING; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTIES;

PRECISION POSITIONING;

MICROSCOPES;

EID: 0142260419     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1605267     Document Type: Article

References (16)

1. G. Binnig and H. Rohrer, Helv. Phys. Acta 55, 726 (1982).
2. R. Sonnenfeld, J. Schneir, B. Drake, P. K. Hansma, and D. E. Aspnes, Appl. Phys. Lett. 50, 1742 (1987).
3. K. Besocke, Surf. Sci. 181, 145 (1987).
4. A. L. de Lozanne, S. H. Pan, H. L. Edwards, D. J. Derro, A. L. Barr, and J. T. Markert, Proc. SPIE 2696, 347 (1996).
5. S. H. Pan, Ph.D. thesis, University of Texas (1991).
6. S. H. Pan, E. W. Hudson, and J. C. Davis, Rev. Sci. Instrum. 70, 1459 (1999).
7. Swiss Jewel Co., 437 Chestnut St., Ste 613, PA 19106.
8. Epoxy Technology, Inc., 14 Fortune Drive, Billerica, MA 0182.
9. Bently Nevada Corp., 1631 Bently Parkway South, Minden, NV 89423.
10. Digital Instruments, Veeco Metrology Group, 112 Robin Hill Rd., CA 93117.
11. C. W. Snyder and A. L. de Lozanne, Rev. Sci. Instrum. 59, 541 (1988).
12. B. L. Weeks, A. Vollmer, M. E. Welland, and T. Rayment, Nanotechnology 13, 38 (2002).
13. D. W. Pohl, Rev. Sci. Instrum. 58, 54 (1987).
14. J. W. Lyding, S. Skala, J. S. Hubacek, R. Brockenbrough, and G. Gammie, Rev. Sci. Instrum. 59, 1897 (1988).
15. 1217-A Unit Pulser, General Radio Company.
16. Ch. Renner, Ph. Niedermann, A. D. Kent, and Ø. Fischer, Rev. Sci. Instrum. 61, 965 (1990).