Microforce materials tester

Review of Scientific Instruments

Volumn 76, Issue 6, 2005, Pages

  Fujii, Yusaku ^a  

^a GUNMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DYNAMIC FORCES; IMPACT FORCE; MATERIAL TESTERS; STATIC FORCES;

CALIBRATION; FRICTION; GRAVITATION; HALL EFFECT; QUANTUM THEORY; SENSORS; TIME AND MOTION STUDY; TRANSDUCERS;

LOADS (FORCES);

EID: 20644447105     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1935431     Document Type: Article

References (18)

1. D. B. Newell, J. A. Kramar, J. R. Pratt, D. T. Smith, and E. R. Williams, IEEE Trans. Instrum. Meas. 52, 508 (2003).
2. J. R. Pratt, D. T. Smith, D. B. Newell, J. A. Kramar, and E. Whitentonrogress, J. Mater. Res. 19, 366 (2004).
3. P. J. Cumpson and J. Hedley, Nanotechnology 14, 1279 (2003).
4. S. Niehe, Proceedings of XVII IMEKO World Congress, Dubrovnik, Croatia, June 2003, p. 335.
5. Y. Fujii and H. Fujimoto, Meas. Sci. Technol. 10, N31 (1999).
6. Y. Fujii, Rev. Sci. Instrum. 72, 3108 (2001).
7. T. Bruns, R. Kumme, M. Kobusch, and M. Peters, Measurement 32, 85 (2002).
8. Y. Fujii, Meas. Sci. Technol. 14, 1741 (2003).
9. R. Kumme, Measurement 23, 239 (1998).
10. Y-K. Park, R. Kumme, and D-I. Kang, Meas. Sci. Technol. 13, 654 (2002).
11. Y-K. Park, R. Kumme, and D-I. Kang, Meas. Sci. Technol. 13, 1311 (2002).
12. Y. Fujii, Meas. Sci. Technol. 14, 1259 (2003).
13. E. R. Williams, R. L. Steiner, D. B. Newell, and P. T. Olsen, Phys. Rev. Lett. 81, 2404 (1998).
14. Y. Fujii, Rev. Sci. Instrum. 74, 3137 (2003).
15. Y. Fujii, H. Fujimoto, and S. Namioka, Rev. Sci. Instrum. 70, 111 (1999).
16. Y. Fujii and T. Yamaguchi, Rev. Sci. Instrum. 75, 119 (2004).
17. Y. Fujii and T. Yamaguchi, J. Mater. Sci. (to be published).
18. Y. Fujii, Mech. Syst. Signal Process. (to be published).