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Volumn 15, Issue 6, 2005, Pages 925-933

Ellipsometric characterization of the optical constants of polyfluorene gain media

Author keywords

[No Author keywords available]

Indexed keywords

FLUORINE COMPOUNDS; LIGHT EMITTING DIODES; PERMITTIVITY; REFRACTIVE INDEX; SILICA; SPECTROPHOTOMETRY; SURFACE PHENOMENA; THICKNESS MEASUREMENT; THIN FILMS;

EID: 20544443247     PISSN: 1616301X     EISSN: None     Source Type: Journal    
DOI: 10.1002/adfm.200400121     Document Type: Article
Times cited : (130)

References (35)
  • 17
    • 20544468460 scopus 로고    scopus 로고
    • M. Campoy Quiles, P. Etchegoin, D. D. C. Bradley, unpubished
    • M. Campoy Quiles, P. Etchegoin, D. D. C. Bradley, unpubished.
  • 35
    • 0004204082 scopus 로고
    • Prentice Hall, Englewood Cliffs, NJ
    • J. T. Verdeyen, Laser Electronics, Prentice Hall, Englewood Cliffs, NJ 1995, pp. 589-592.
    • (1995) Laser Electronics , pp. 589-592
    • Verdeyen, J.T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.