Dielectric properties of (Ba0.8Sr0.2) (ZrxTi1-x)O3 thin films grown by pulsed-laser deposition

Journal of the European Ceramic Society

Volumn 25, Issue 12 SPEC. ISS., 2005, Pages 2295-2298

  Cheng, B L ^a   Wang, Can ^a   Wang, S Y ^a   Lu, H B ^a   Zhou, Y L ^a   Chen, Z H ^a   Yang, G Z ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

(Ba, Sr)(Zr, Ti)O3; Dielectric properties; Perovskite

Indexed keywords

CRYSTALLIZATION; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES; ELECTRIC FIELDS; FERROELECTRICITY; FILM GROWTH; LEAKAGE CURRENTS; PERMITTIVITY; PLATINUM; POLARIZATION; PULSED LASER DEPOSITION; SILICON; THIN FILMS; TITANIUM DIOXIDE; X RAY DIFFRACTION ANALYSIS;

FERROELECTRIC POLARIZATION; POLARIZATION LOOPS; TUNABILITY;

BARIUM COMPOUNDS;

FILM;

EID: 20444493558     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jeurceramsoc.2005.03.049     Document Type: Article

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