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Volumn 75, Issue 4, 2004, Pages 1061-1067
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Highly stable atom-tracking scanning tunneling microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMS;
CLOSED LOOP CONTROL SYSTEMS;
COMPUTER SIMULATION;
CRYSTAL LATTICES;
CRYSTALLINE MATERIALS;
GRAPHITE;
HIGH PASS FILTERS;
LOW PASS FILTERS;
NATURAL FREQUENCIES;
NUMERICAL ANALYSIS;
SERVOMECHANISMS;
TWO TERM CONTROL SYSTEMS;
ATOM-TRACKING CONTROL;
CRYSTALLINE SURFACE;
LATTICE SPACING;
OPEN-LOOP TRACKING SYSTEM;
SCANNING TUNNELING MICROSCOPY;
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EID: 2042474136
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1651637 Document Type: Article |
Times cited : (16)
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References (14)
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