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Volumn 75, Issue 4, 2004, Pages 1061-1067

Highly stable atom-tracking scanning tunneling microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; CLOSED LOOP CONTROL SYSTEMS; COMPUTER SIMULATION; CRYSTAL LATTICES; CRYSTALLINE MATERIALS; GRAPHITE; HIGH PASS FILTERS; LOW PASS FILTERS; NATURAL FREQUENCIES; NUMERICAL ANALYSIS; SERVOMECHANISMS; TWO TERM CONTROL SYSTEMS;

EID: 2042474136     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1651637     Document Type: Article
Times cited : (16)

References (14)
  • 9
    • 2042467975 scopus 로고    scopus 로고
    • LI5610, Tsunashima Higashi, Kohoku, Yokohama, Japan
    • NF Corporation: LI5610, Tsunashima Higashi, Kohoku, Yokohama, Japan.
  • 10
    • 0004130754 scopus 로고    scopus 로고
    • 520 East Montecio Street, Santa Barbara, CA 93103
    • Digital Instrument: Nanoscope III, 520 East Montecio Street, Santa Barbara, CA 93103.
    • Nanoscope III
  • 11
    • 2042460411 scopus 로고    scopus 로고
    • ADSP324-00A & ADPS324-13, 3-2-8 Tadakou, Toyohashi, Aichi, 440-0004, Japan.
    • Chubu Electric Power Co. Inc.: ADSP324-00A & ADPS324-13, 3-2-8 Tadakou, Toyohashi, Aichi, 440-0004, Japan.
  • 14
    • 2042521367 scopus 로고    scopus 로고
    • SIMULINK is a registered trademark of the MathWorks, Inc., 24 Prime Park Way, Natick, MA 01760
    • SIMULINK is a registered trademark of the MathWorks, Inc., 24 Prime Park Way, Natick, MA 01760.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.