-
1
-
-
0542374952
-
-
deMello, J. C.; Tessler, N.; Graham, S. C.; Friend, R. H. Phys. Rev. B 1998, 57, 12951.
-
(1998)
Phys. Rev. B
, vol.57
, pp. 12951
-
-
DeMello, J.C.1
Tessler, N.2
Graham, S.C.3
Friend, R.H.4
-
2
-
-
0029893208
-
-
Pei, Q.; Yang, Y.; Yu, G.; Zhang, C.; Heeger, A. J. J. Am. Chem. Soc. 1996, 118, 3922.
-
(1996)
J. Am. Chem. Soc.
, vol.118
, pp. 3922
-
-
Pei, Q.1
Yang, Y.2
Yu, G.3
Zhang, C.4
Heeger, A.J.5
-
3
-
-
0029359942
-
-
Pei, Q.; Yu, G.; Zhang, C.; Yang, Y.; Heeger, A. J. Science 1995, 269, 1086.
-
(1995)
Science
, vol.269
, pp. 1086
-
-
Pei, Q.1
Yu, G.2
Zhang, C.3
Yang, Y.4
Heeger, A.J.5
-
4
-
-
2342471438
-
-
Edman, L.; Pauchard, M.; Moses, D.; Heeger, A. J. J. Appl. Phys. 2004, 95, 4357.
-
(2004)
J. Appl. Phys.
, vol.95
, pp. 4357
-
-
Edman, L.1
Pauchard, M.2
Moses, D.3
Heeger, A.J.4
-
7
-
-
0029799817
-
-
Maness, K. M.; Terrill, R. H.; Meyer, T. J.; Murray, R. W.; Wightman, R. M. J. Am. Chem. Soc. 1996, 118, 10609.
-
(1996)
J. Am. Chem. Soc.
, vol.118
, pp. 10609
-
-
Maness, K.M.1
Terrill, R.H.2
Meyer, T.J.3
Murray, R.W.4
Wightman, R.M.5
-
8
-
-
0032099190
-
-
Gao, J.; Yu, G.; Heeger, A. J. Adv. Mater. 1998, 10, 692.
-
(1998)
Adv. Mater.
, vol.10
, pp. 692
-
-
Gao, J.1
Yu, G.2
Heeger, A.J.3
-
9
-
-
0000989289
-
-
Chen, X. L.; Bao, Z.; Schon, J. H.; Lovinger, A. J.; Li, Y.-Y.; Crone, B.; Dodabalapur, A.; Batlogg, B. Appl. Phys. Lett. 2001, 78, 228.
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 228
-
-
Chen, X.L.1
Bao, Z.2
Schon, J.H.3
Lovinger, A.J.4
Li, Y.-Y.5
Crone, B.6
Dodabalapur, A.7
Batlogg, B.8
-
10
-
-
0000742840
-
-
Kittlesen, G. P.; White, H. S.; Wrighton, M. S. J. Am. Chem. Soc. 1985, 107, 7373.
-
(1985)
J. Am. Chem. Soc.
, vol.107
, pp. 7373
-
-
Kittlesen, G.P.1
White, H.S.2
Wrighton, M.S.3
-
11
-
-
0001031436
-
-
Ofer, D.; Crooks, R. M.; Wrighton, M. S. J. Am. Chem. Soc. 1990, 112, 7869.
-
(1990)
J. Am. Chem. Soc.
, vol.112
, pp. 7869
-
-
Ofer, D.1
Crooks, R.M.2
Wrighton, M.S.3
-
12
-
-
0037016606
-
-
Nilsson, D.; Chen, M.; Kugler, T.; Remonen, T.; Armgarth, M.; Berggren, M. Adv. Mater. 2002, 14, 51.
-
(2002)
Adv. Mater.
, vol.14
, pp. 51
-
-
Nilsson, D.1
Chen, M.2
Kugler, T.3
Remonen, T.4
Armgarth, M.5
Berggren, M.6
-
13
-
-
1542456809
-
-
Thackeray, J. W.; White, H. S.; Wrighton, M. S. J. Phys. Chem. 1985, 89, 5133.
-
(1985)
J. Phys. Chem.
, vol.89
, pp. 5133
-
-
Thackeray, J.W.1
White, H.S.2
Wrighton, M.S.3
-
14
-
-
20344376357
-
-
Molecular Memory Device. U. S. Pat. Appl.
-
Bulovic, V.; Mandell, A.; Perlman, A. Molecular Memory Device. U. S. Pat. Appl. 2004, 11.
-
(2004)
, pp. 11
-
-
Bulovic, V.1
Mandell, A.2
Perlman, A.3
-
15
-
-
20344401266
-
-
Addressable and electrically reversible memory switch. U. S. Pat. Appl. Publ.
-
Bulovic, V.; Mandell, A.; Perlman, A. Addressable and electrically reversible memory switch. U. S. Pat. Appl. Publ. 2004, 11.
-
(2004)
, pp. 11
-
-
Bulovic, V.1
Mandell, A.2
Perlman, A.3
-
16
-
-
79957932398
-
-
Chen, M.; Nilsson, D.; Kugler, T.; Berggren, M.; Remonen, T. Appl. Phys. Lett. 2002, 81, 2011.
-
(2002)
Appl. Phys. Lett.
, vol.81
, pp. 2011
-
-
Chen, M.1
Nilsson, D.2
Kugler, T.3
Berggren, M.4
Remonen, T.5
-
17
-
-
0002835440
-
-
Abruna, H. D.; Denisevich, P.; Umana, M.; Meyer, T. J.; Murray, R. W. J. Am. Chem. Soc. 1981, 103, 1.
-
(1981)
J. Am. Chem. Soc.
, vol.103
, pp. 1
-
-
Abruna, H.D.1
Denisevich, P.2
Umana, M.3
Meyer, T.J.4
Murray, R.W.5
-
18
-
-
33845556644
-
-
Denisevich, P.; Willman, K. W.; Murray, R. W. J. Am. Chem. Soc. 1981, 103, 4727.
-
(1981)
J. Am. Chem. Soc.
, vol.103
, pp. 4727
-
-
Denisevich, P.1
Willman, K.W.2
Murray, R.W.3
-
19
-
-
0021410605
-
-
Pickup, P. G.; Leidner, C. R.; Denisevich, P.; Murray, R. W. J. Electroanal. Chem. 1984, 164, 39.
-
(1984)
J. Electroanal. Chem.
, vol.164
, pp. 39
-
-
Pickup, P.G.1
Leidner, C.R.2
Denisevich, P.3
Murray, R.W.4
-
21
-
-
0021754860
-
-
Pickup, P. G.; Kutner, W.; Leidner, C. R.; Murray, R. W. J. Am. Chem. Soc. 1984, 106, 1991.
-
(1984)
J. Am. Chem. Soc.
, vol.106
, pp. 1991
-
-
Pickup, P.G.1
Kutner, W.2
Leidner, C.R.3
Murray, R.W.4
-
22
-
-
0000668318
-
-
Langsdorf, B. L.; Zhou, X.; Adler, D. H.; Lonergan, M. C. Macromolecules 1999, 32, 2796.
-
(1999)
Macromolecules
, vol.32
, pp. 2796
-
-
Langsdorf, B.L.1
Zhou, X.2
Adler, D.H.3
Lonergan, M.C.4
-
23
-
-
0037196334
-
-
Lonergan, M. C.; Cheng, C. H.; Langsdorf, B. L.; Zhou, X. J. Am. Chem. Soc. 2002, 124, 690.
-
(2002)
J. Am. Chem. Soc.
, vol.124
, pp. 690
-
-
Lonergan, M.C.1
Cheng, C.H.2
Langsdorf, B.L.3
Zhou, X.4
-
24
-
-
3242715651
-
-
Cheng, C. H. W.; Boettcher, S. W.; Johnston, D. H.; Lonergan, M. C. J. Am. Chem. Soc. 2004, 126, 8666.
-
(2004)
J. Am. Chem. Soc.
, vol.126
, pp. 8666
-
-
Cheng, C.H.W.1
Boettcher, S.W.2
Johnston, D.H.3
Lonergan, M.C.4
-
26
-
-
0035836815
-
-
Langsdorf, B. L.; Zhou, X.; Lonergan, M. C. Macromolecules 2001, 34, 2450.
-
(2001)
Macromolecules
, vol.34
, pp. 2450
-
-
Langsdorf, B.L.1
Zhou, X.2
Lonergan, M.C.3
-
27
-
-
0021622794
-
-
Kaufman, J. H.; Chung, T.-C.; Heeger, A. J. J. Electrochem. Soc. 1984, 131, 2847.
-
(1984)
J. Electrochem. Soc.
, vol.131
, pp. 2847
-
-
Kaufman, J.H.1
Chung, T.-C.2
Heeger, A.J.3
-
28
-
-
20344404657
-
-
note
-
-2 for the system and an RC time constant of 1 ms.
-
-
-
-
30
-
-
0032074862
-
-
Manzanares, J. A.; Riess, H.; Heeger, A. J. J. Phys. Chem. B 1998, 102, 4327.
-
(1998)
J. Phys. Chem. B
, vol.102
, pp. 4327
-
-
Manzanares, J.A.1
Riess, H.2
Heeger, A.J.3
-
32
-
-
0041340531
-
-
Rudmann, H.; Shimada, S.; Rubner, M. F. J. Appl. Phys. 2003, 94, 115.
-
(2003)
J. Appl. Phys.
, vol.94
, pp. 115
-
-
Rudmann, H.1
Shimada, S.2
Rubner, M.F.3
-
33
-
-
0000367327
-
-
Sampietro, M.; Sotgiu, R.; Wenzl, F. P.; Holzer, L.; Tasch, S.; Leising, G. Phys. Rev. B 2000, 61, 266.
-
(2000)
Phys. Rev. B
, vol.61
, pp. 266
-
-
Sampietro, M.1
Sotgiu, R.2
Wenzl, F.P.3
Holzer, L.4
Tasch, S.5
Leising, G.6
-
35
-
-
0037140790
-
-
Buda, M.; Kalyuzhny, G.; Bard, A. J. J. Am. Chem. Soc. 2002, 124, 6090.
-
(2002)
J. Am. Chem. Soc.
, vol.124
, pp. 6090
-
-
Buda, M.1
Kalyuzhny, G.2
Bard, A.J.3
-
36
-
-
19744382465
-
-
Edman, L.; Summers, M. A.; Buratto, S. K.; Heeger, A. J. Phys. Rev. B 2004, 70, 115212/1.
-
(2004)
Phys. Rev. B
, vol.70
-
-
Edman, L.1
Summers, M.A.2
Buratto, S.K.3
Heeger, A.J.4
-
41
-
-
0024656305
-
-
Ganapathiappan, S.; Chen, K.; Shriver, D. F. J. Am. Chem. Soc. 1989, 111, 4091.
-
(1989)
J. Am. Chem. Soc.
, vol.111
, pp. 4091
-
-
Ganapathiappan, S.1
Chen, K.2
Shriver, D.F.3
-
42
-
-
0002571065
-
-
Doan, K. E.; Ratner, M. A.; Shriver, D. F. Chem. Mater. 1991, 3, 418.
-
(1991)
Chem. Mater.
, vol.3
, pp. 418
-
-
Doan, K.E.1
Ratner, M.A.2
Shriver, D.F.3
-
43
-
-
0024664011
-
-
Jacobs, P. W. M.; Lorimer, J. W.; Russer, A.; Wasiucionek, M. J. Power Sources 1989, 26, 503.
-
(1989)
J. Power Sources
, vol.26
, pp. 503
-
-
Jacobs, P.W.M.1
Lorimer, J.W.2
Russer, A.3
Wasiucionek, M.4
-
44
-
-
0026888130
-
-
Vallee, A.; Besner, S.; Prud'homme, J. Electrochim. Acta 1992, 37, 1579.
-
(1992)
Electrochim. Acta
, vol.37
, pp. 1579
-
-
Vallee, A.1
Besner, S.2
Prud'homme, J.3
-
45
-
-
0023979040
-
-
Zahurak, S. M.; Kaplan, M. L.; Rietman, E. A.; Murphy, D. W.; Cava, R. J. Macromolecules 1988, 21, 654.
-
(1988)
Macromolecules
, vol.21
, pp. 654
-
-
Zahurak, S.M.1
Kaplan, M.L.2
Rietman, E.A.3
Murphy, D.W.4
Cava, R.J.5
-
49
-
-
20344382457
-
-
note
-
In non-MIECs, the observation of a thickness dependence can be consistent with interfacial processes limiting charge transport as in the case of Fowler-Nordheim tunneling in a metal | insulator | metal system.
-
-
-
-
50
-
-
20344381240
-
-
note
-
This is referring only to the electronic carriers. For instance, the double-layer charges refer to the excess electrons or holes on the surface of the metal electrodes, which are balanced by ionic charges within the polymer film. Similarly, the electrons or holes stored in doped states are balanced by ions within the polymer sample.
-
-
-
-
51
-
-
20344380631
-
-
note
-
-3.
-
-
-
-
52
-
-
0037443016
-
-
Rep, D. B. A.; Morpurgo, A. F.; Sloof, W. G.; Klapwijk, T. M. J. Appl. Phys. 2003, 93, 2082.
-
(2003)
J. Appl. Phys.
, vol.93
, pp. 2082
-
-
Rep, D.B.A.1
Morpurgo, A.F.2
Sloof, W.G.3
Klapwijk, T.M.4
-
53
-
-
20344384477
-
-
note
-
-1.
-
-
-
-
54
-
-
0032046584
-
-
Pichot, F.; Bloom, C. J.; Rider, L. S.; Elliott, C. M. J. Phys. Chem. B 1998, 102, 3523.
-
(1998)
J. Phys. Chem. B
, vol.102
, pp. 3523
-
-
Pichot, F.1
Bloom, C.J.2
Rider, L.S.3
Elliott, C.M.4
-
55
-
-
0001496985
-
-
Dalton, E. F.; Surridge, N. A.; Jernigan, J. C.; Wilbourn, K. O.; Facci, J. S.; Murray, R. W. Chem. Phys. 1990, 141, 143.
-
(1990)
Chem. Phys.
, vol.141
, pp. 143
-
-
Dalton, E.F.1
Surridge, N.A.2
Jernigan, J.C.3
Wilbourn, K.O.4
Facci, J.S.5
Murray, R.W.6
-
57
-
-
0026747557
-
-
Buck, R. P.; Surridge, N. A.; Murray, R. W. J. Electrochem. Soc. 1992, 139, 136.
-
(1992)
J. Electrochem. Soc.
, vol.139
, pp. 136
-
-
Buck, R.P.1
Surridge, N.A.2
Murray, R.W.3
-
58
-
-
12944275673
-
-
deMello, J. C.; Halls, J. J. M.; Graham, S. C.; Tessler, N.; Friend, R. H. Phys. Rev. Lett. 2000, 85, 421.
-
(2000)
Phys. Rev. Lett.
, vol.85
, pp. 421
-
-
Demello, J.C.1
Halls, J.J.M.2
Graham, S.C.3
Tessler, N.4
Friend, R.H.5
-
59
-
-
0030408858
-
-
Dick, D. J.; Heeger, A. J.; Yang, Y.; Pei, Q. Adv. Mater. 1996, 8, 985.
-
(1996)
Adv. Mater.
, vol.8
, pp. 985
-
-
Dick, D.J.1
Heeger, A.J.2
Yang, Y.3
Pei, Q.4
-
60
-
-
0000359091
-
-
Gao, J.; Heeger, A. J.; Campbell, I. H.; Smith, D. L. Phys. Rev. B 1999, 59, R2482.
-
(1999)
Phys. Rev. B
, vol.59
-
-
Gao, J.1
Heeger, A.J.2
Campbell, I.H.3
Smith, D.L.4
|