SCOPUS 정보 검색 플랫폼

Materials Research Society Symposium Proceedings

Volumn 840, Issue , 2005, Pages 131-136

Reciprocal-lattice space imaging of X-ray intensities diffracted from nanowires

(9) Sakata, Osami a Kitano, Akiko a Yashiro, Wataru b Sakamoto, Kunihiro c Miki, Kazushi b Matsuda, Akifumi d Hara, Wakana d Akiba, Shusaku d Yoshimoto, Mamoru d

a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE (Japan)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

c NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST (Japan)

d TOKYO INSTITUTE OF TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; IMAGING TECHNIQUES; NONDESTRUCTIVE EXAMINATION; SAPPHIRE; SYNCHROTRONS; X RAY DIFFRACTION ANALYSIS;

NANOPHOTONICS; NANOWIRES; SUPERSTRUCTURE; X-RAY INTENSITY;

NANOSTRUCTURED MATERIALS;

EID: 20344395126 PISSN: 02729172 EISSN: None Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper

Times cited : (7)

References (9)

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