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Volumn 585, Issue 3, 2005, Pages 144-154
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Polarization modification of PZT thin films by means of electric fields and stress in scanning force microscopy
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IFW DRESDEN
(Germany)
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Author keywords
Ferroelectricity; Microscopy atomic force; Polarization dielectric; Thin films dielectric
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYSTALS;
DIELECTRIC MATERIALS;
ELECTRIC FIELD EFFECTS;
ELECTROSTATICS;
FERROELECTRICITY;
MAXWELL EQUATIONS;
POLARIZATION;
SCANNING;
STRESS ANALYSIS;
SWITCHING;
MICROSCOPY ATOMIC FORCE;
POLARIZATION DIELECTRICS;
POLARIZATION SWITCHING;
THIN FILMS DIELECTRICS;
THIN FILMS;
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EID: 20344385960
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2005.03.064 Document Type: Article |
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Times cited : (2)
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References (17)
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