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Volumn 34, Issue 5, 2005, Pages 600-604

Novel interconnection method using electrically conductive paste with fusible filler

Author keywords

Conductive path; Electrically conductive paste; Fluxless; Low melting point alloy

Indexed keywords

ADHESION; COALESCENCE; CURING; ELECTRIC CONDUCTIVITY; ELECTRODES; MELTING; OPTICAL INTERCONNECTS; RESINS; SCANNING ELECTRON MICROSCOPY; WETTING; X RAYS;

EID: 20344382038     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-005-0071-z     Document Type: Conference Paper
Times cited : (26)

References (18)
  • 1
    • 0004255519 scopus 로고
    • New York: John Wiley & Sons
    • A. Rahn, The Basics of Soldering (New York: John Wiley & Sons, 1993), pp. 1-102.
    • (1993) The Basics of Soldering , pp. 1-102
    • Rahn, A.1
  • 5
    • 0003512080 scopus 로고    scopus 로고
    • Port Erin, Isle of Man, U.K.: Electrochemical Publications Ltd.
    • J. Liu, Conductive Adhesives for Electronics Packaging (Port Erin, Isle of Man, U.K.: Electrochemical Publications Ltd., 1999), pp. 1-432.
    • (1999) Conductive Adhesives for Electronics Packaging , pp. 1-432
    • Liu, J.1
  • 15
    • 0021655598 scopus 로고
    • eds. A.D. Romig, Jr. and J.I. Goldstein (San Francisco, CA: San Francisco Press Inc.)
    • A.D. Romig, Jr., F.G. Yost, and P.F. Hlava, in Microbeam Analysis, eds. A.D. Romig, Jr. and J.I. Goldstein (San Francisco, CA: San Francisco Press Inc., 1984), pp. 87-92.
    • (1984) Microbeam Analysis , pp. 87-92
    • Romig Jr., A.D.1    Yost, F.G.2    Hlava, P.F.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.