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Volumn 79, Issue 1-2, 2005, Pages 106-109

Surface ripple amplification and attenuation by sputtering with diametrically opposed ion fluxes

Author keywords

Depth profiling; Ion bombardment; Sputtering; Surface morphology; Surface ripples

Indexed keywords

AMPLIFICATION; ATTENUATION; DIFFUSION; FOURIER TRANSFORMS; ION BOMBARDMENT; IONS; MORPHOLOGY; SPUTTERING; VISCOUS FLOW;

EID: 20344361983     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2005.01.011     Document Type: Article
Times cited : (12)

References (25)
  • 8
    • 20344377824 scopus 로고    scopus 로고
    • Makeev M, Cuerno R, Barabasi A-L. arXiv:cond-mat/0007354 v1 July 2000
    • Makeev M, Cuerno R, Barabasi A-L. arXiv:cond-mat/0007354 v1 July 2000.
  • 24
    • 9544235184 scopus 로고    scopus 로고
    • G. Carter Vacuum 77 2004 97 100
    • (2004) Vacuum , vol.77 , pp. 97-100
    • Carter, G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.