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Volumn 79, Issue 1-2, 2005, Pages 106-109
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Surface ripple amplification and attenuation by sputtering with diametrically opposed ion fluxes
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Author keywords
Depth profiling; Ion bombardment; Sputtering; Surface morphology; Surface ripples
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Indexed keywords
AMPLIFICATION;
ATTENUATION;
DIFFUSION;
FOURIER TRANSFORMS;
ION BOMBARDMENT;
IONS;
MORPHOLOGY;
SPUTTERING;
VISCOUS FLOW;
DEPTH PROFILING;
SURFACE HEIGHTS;
SURFACE RIPPLES;
WAVE VECTORS;
SURFACE PHENOMENA;
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EID: 20344361983
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.vacuum.2005.01.011 Document Type: Article |
Times cited : (12)
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References (25)
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