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Volumn 144-147, Issue , 2005, Pages 1063-1065

A novel probe of intrinsic electronic structure: Hard X-ray photoemission spectroscopy

Author keywords

Bulk probe; Electronic structure; Photoemission spectroscopy

Indexed keywords

ATTENUATION; CRYOSTATS; ELECTRONIC STRUCTURE; PHOTOIONIZATION; SPECTROSCOPIC ANALYSIS; SYNCHROTRON RADIATION; ULTRAVIOLET SPECTROSCOPY; X RAYS;

EID: 20244382707     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2005.01.044     Document Type: Conference Paper
Times cited : (11)

References (14)
  • 2
    • 17444428794 scopus 로고    scopus 로고
    • The electron inelastic-mean-free-paths were estimated using NIST Standard Reference Database 71
    • and references therein
    • The electron inelastic-mean-free-paths were estimated using NIST Standard Reference Database 71, "NIST Electron Inelastic-Mean-Free-Path Database: Ver. 1.1". It is distributed via the Web site http://www.nist.gov/srd/ nist71.htm, and references therein.
    • NIST Electron Inelastic-Mean-Free-Path Database: Ver. 1.1
  • 13
    • 17444366384 scopus 로고    scopus 로고
    • M. Taguchi, et al., cond-mat/0404200, Phys. Rev. B, in press
    • M. Taguchi, et al., cond-mat/0404200, Phys. Rev. B, in press.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.