SCOPUS 정보 검색 플랫폼

Volumn 275, Issue 1-2, 2005, Pages

Influence of substrate materials on the properties of CdTe thin films grown by hot-wall epitaxy

(10) Bilevych, Ye a Soshnikov, A b Darchuk, L a Apatskaya, M a Tsybrii, Z a Vuychik, M a Boka, A a Sizov, F a Boelling, O c Sulkio Cleff, B c

a INSTITUTE OF SEMICONDUCTOR PHYSICS (Ukraine)

b TECHNOLOGICAL INSTITUTE FOR SUPERHARD AND NOVEL CARBON MATERIALS (Russian Federation)

c UNIVERSITY OF MÜNSTER (Germany)

Author keywords

A1. Surface structure; A3. Hot wall epitaxy; A3. Thin film; B1. Cadmium telluride

Indexed keywords

ATOMIC FORCE MICROSCOPY; CADMIUM COMPOUNDS; CRYSTAL GROWTH; CRYSTAL STRUCTURE; ELECTRIC POTENTIAL; PHOTODIODES; SURFACE STRUCTURE; X RAY DIFFRACTION ANALYSIS;

CADMIUM TELLURIDE; CURRENT-VOLTAGE; DEFECT-FREE-SURFACES; HOT WALL EPITAXY;

THIN FILMS;

EID: 20144375444 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/j.jcrysgro.2004.11.207 Document Type: Conference Paper

Times cited : (18)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.