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Volumn 103, Issue 2, 1996, Pages 183-187

The behavior of the surface charge density in HgxCd1-xTe epilayers due to hydrogenation and annealing

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CADMIUM COMPOUNDS; ELECTRIC CHARGE; EPITAXIAL GROWTH; HYDROGENATION; SURFACE PROPERTIES; TELLURIUM COMPOUNDS; THIN FILMS;

EPILAYERS;

MERCURY COMPOUNDS;

EID: 0030264126 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/0169-4332(96)00473-4 Document Type: Article

Times cited : (1)

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