Growth and properties of Ge1-xSix mosaic single crystals for γ-ray lens application

Journal of Crystal Growth

Volumn 275, Issue 1-2, 2005, Pages

  Abrosimov, N V ^a   Ludge A ^a   Riemann, H ^a   Kurlov, V N ^b   Borissova, D ^c   Klemm, V ^c   Halloin, H ^d   Von Ballmoos, P ^d   Bastie, P ^e   Hamelin, B ^e   Smither, R K ^f  

^a LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

^b INSTITUTE OF SOLID STATE PHYSICS   (Russian Federation)

^c TU BERGAKADEMIE FREIBERG   (Germany)

^d IRAP   (France)

^e INSTITUT LAUE LANGEVIN   (France)

^f ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

A1. Crystal structure; A1. Interfaces; A1. Solid solutions; A2. Czochralski method; B1. Germanium silicon alloys; B1. Mosaic crystals

Indexed keywords

CRYSTAL GROWTH; CRYSTAL ORIENTATION; CRYSTAL STRUCTURE; DETECTORS; DIFFRACTIVE OPTICS; GAMMA RAYS; SINGLE CRYSTALS; SOLID SOLUTIONS;

AXIAL GRADIENTS; CZOCHRALSKI METHODS; GERMANIUM SILICON ALLOYS; MOSAIC CRYSTALS;

SEMICONDUCTING GERMANIUM COMPOUNDS;

EID: 20144372464     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2004.11.110     Document Type: Conference Paper

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