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Crystal Research and Technology

Volumn 37, Issue 7, 2002, Pages 685-704

Laterally-graded SiGe crystals for high resolution synchrotron optics

(3) Erko, A a Abrosimov, N V b Alex, V b

a HAHN MEITNER INSTITUT (Germany)

b LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH (Germany)

Author keywords

Graded crystals; SiGe; Synchrotron radiation

Indexed keywords

COMPOSITION; CRYSTAL GROWTH FROM MELT; CRYSTALS; DIFFRACTION; LATTICE CONSTANTS; MONOCHROMATORS; SYNCHROTRON RADIATION; X RAY DIFFRACTION ANALYSIS;

BRAGG ANGLE; GRADED CRYSTALS; HIGH RESOLUTION SYNCHROTRON OPTICS; SILICON GERMANIUM ALLOY;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 0036064860 PISSN: 02321300 EISSN: None Source Type: Journal
DOI: 10.1002/1521-4079(200207)37:7<685::AID-CRAT685>3.0.CO;2-Z Document Type: Article

Times cited : (36)

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