Gas-phase ion/molecule reactions in C5F8

Journal of Physical Chemistry A

Volumn 109, Issue 6, 2005, Pages 1049-1056

  Hiraoka, K ^a   Fujita, K ^a   Ishida, M ^a   Ichikawa, T ^a   Okada, H ^a   Hiizumi, K ^a   Wada, A ^a   Takao, K ^a   Yamabe, S ^b   Tsuchida, N ^b  

^a UNIVERSITY OF YAMANASHI   (Japan)

^b NARA UNIVERSITY OF EDUCATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE TRANSFER; CHEMICAL VAPOR DEPOSITION; ELECTRON BEAMS; ELECTRONS; ELECTROSTATICS; FLUOROCARBONS; IONIZATION; MASS SPECTROMETRY; MOLECULAR DYNAMICS; PERMITTIVITY;

ELECTRON AFFINITY; ELECTROSTATIC INTERACTION; PULSED ELECTRON BEAM MASS SPECTROMETERS; THERMOCHEMICAL STABILITY;

REACTION KINETICS;

EID: 20044391411     PISSN: 10895639     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp040251k     Document Type: Article

References (13)

1. Takahashi, K.; Itoh, A.; Nakamura, T.; Tachibana, K. Thin Solid Films 2000, 374, 303.
2. Schaepkens, M.; Standaert, T. E. F. M.; Rueger, N. R.; Sebel, P. G. M.; Oehrlein, G. S.; Cook, J. M. J. Vac. Sci. Technol. 1999, A17, 26.
3. Endo, K.; Shinoda, K.; Tatsumi, T. J. Appl. Phys. 1999, 86, 2739.
4. Shirafuji, T. Oyo Butsuri 1999, 68, 532 (in Japanese).
5. Hiraoka. K.; Mizuno, T.; Eguchi, D.; Takao, K.; Iino, T.; Yamabe, S. J. Chem. Phys. 2002, 116, 7574.
6. Hiraoka, K.; Takao, K.; lino, T.; Nakagawa, F.; Suyama, H.; Mizuno, T.; Yamabe, S. J. Phys. Chem. A 2002, 106, 603.
7. Hunter, E. L.; Lias, S. G. J. Phys. Chem. Ref. Data 1998, 27, 413.
8. Kebarle, P. In Techniques for the Study of Ion - Molecule Reactions; Farrar, J. M., Saunders, W. H., Eds.; Wiley: New York, 1988.
9. Hiraoka, K. J. Chem. Phys. 1987, 87, 4048.
10. Becke, A. D. J. Chem. Phys. 1993, 98, 5648.
11. Frisch, M. J.; Trucks, G. W.; Schlegel, H. B.; Scuseria, G. E.; Robb, M. A.; Cheeseman, J. R.; Zakrzewski, V. G.; Montgomery, J. A., Jr.; Stratmann, R. E.; Burant, J. C.; Dapprich, S.; Millam, J. M.; Daniels, A. D.; Kudin, K. N.; Strain, M. C.; Farkas, O.; Tomasi, J.; Barone, V.; Cossi, M.; Cammi, R.; Mennucci, B.; Pomelli, C.; Adamo, C.; Clifford, S.; Ochterski, J.; Petersson, G. A.; Ayala, P. Y.; Cui, Q.; Morokuma, K.; Malick, D. K.; Rabuck, A. D.; Raghavachari, K.; Foresman, J. B.; Cioslowski, J.; Ortiz, J. V.; Stefanov, B. B.; Liu, G.; Liashenko, A.; Piskorz, P.; Komaromi, I.; Gomperts, R.; Martin, R. L.; Fox, D. J.; Keith, T.; Al-Laham, M. A.; Peng, C. Y.; Nanayakkara, A.; Gonzalez, C.; Challacombe, M.; Gill, P. M. W.; Johnson, B. G.; Chen, W.; Wong, M. W.; Andres, J. L.; Head-Gordon, M.; Replogle, E. S.; Pople, J. A. Gaussian 98, revision A.7; Gaussian, Inc.: Pittsburgh, PA, 1998.
12. Pai, R. Y.; Christophorou, L.G.; Christodoulides, A. A J. Chem. Phys. 1979, 70, 1169.
13. Hierl, P. M.; Paulson, J. F. J. Chem. Phys. 1984, 80, 4890.