Optoelectronic and microstructure attributes of epitaxial SrTi O3 on Si

Journal of Applied Physics

Volumn 97, Issue 1, 2005, Pages

  Myhajlenko, S ^a   Bell, A ^b   Ponce, F ^b   Edwards, J L ^c   Wei, Y ^c   Craigo, B ^c   Convey, D ^c   Li, H ^c   Liu, R ^c   Kulik, J ^c  

^a Arizona State University   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

^c MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL QUALITY; FILM QUALITY; HIGH-RESISTIVITY SUBSTRATES; MICROSTRUCTURE ATTRIBUTES;

ATOMIC FORCE MICROSCOPY; CATHODOLUMINESCENCE; MICROSTRUCTURE; OPTOELECTRONIC DEVICES; PHOTOLUMINESCENCE; PHOTONS; RAMAN SPECTROSCOPY; SILICON; SINGLE CRYSTALS; STRONTIUM COMPOUNDS; SUBSTRATES; THERMAL EFFECTS; TITANIUM COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

MOLECULAR BEAM EPITAXY;

EID: 19944431134     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1821643     Document Type: Article

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