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Volumn 42, Issue 6, 2000, Pages 1116-1119
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Influence of mobile charged defects on the dielectric non-linearity of thin ferroelectric PZT films
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0034343569
PISSN: 10637834
EISSN: None
Source Type: Journal
DOI: 10.1134/1.1131325 Document Type: Article |
Times cited : (13)
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References (11)
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