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Volumn 42, Issue 6, 2000, Pages 1116-1119

Influence of mobile charged defects on the dielectric non-linearity of thin ferroelectric PZT films

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EID: 0034343569     PISSN: 10637834     EISSN: None     Source Type: Journal    
DOI: 10.1134/1.1131325     Document Type: Article
Times cited : (13)

References (11)
  • 5
    • 0041135333 scopus 로고
    • V. K. Yarmarkin, N. V. Zaǐtseva, S. V. Shtel'makh, and A. V. Motornyǐ, Fiz. Tverd. Tela (St. Petersburg) 37 (2), 324 (1995) [Phys. Solid State 37 (2), 176 (1995)].
    • (1995) Phys. Solid State , vol.37 , Issue.2 , pp. 176


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.