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Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 232, Issue 1-4, 2005, Pages 249-253

Secondary ion emission from solid surfaces irradiated with highly charged ions

(8) Tona, Masahide a Nagata, Kazuo b Takahashi, Satoshi b Nakamura, Nobuyuki b Yoshiyasu, Nobuo b Sakurai, Makoto c Yamada, Chikashi b Ohtani, Shunsuke b

a JAPAN SCIENCE AND TECHNOLOGY AGENCY (Japan)

b UNIVERSITY OF ELECTRO COMMUNICATIONS (Japan)

c KOBE UNIVERSITY (Japan)

Author keywords

HCI; Highly charged ion; Potential sputtering; SIMS

Indexed keywords

HYDROGENATION; IONS; IRRADIATION; LOW ENERGY ELECTRON DIFFRACTION; POTENTIAL ENERGY; SCANNING TUNNELING MICROSCOPY; SENSITIVITY ANALYSIS; SOLIDS; SUPERCONDUCTING MAGNETS;

CARBON CLUSTERS; HIGHLY CHARGED IONS (HCI); MOLECULAR COMPONENTS; POTENTIAL SPUTTERING;

SECONDARY ION MASS SPECTROMETRY;

EID: 19944414313 PISSN: 0168583X EISSN: None Source Type: Journal
DOI: 10.1016/j.nimb.2005.03.053 Document Type: Conference Paper

Times cited : (4)

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