Local denoising of digital speckle pattern interferometry fringes by multiplicative correlation and weighted smoothing splines

Applied Optics

Volumn 44, Issue 14, 2005, Pages 2728-2735

  Federico, Alejandro ^a   Kaufmann, Guillermo H ^b,c  

^a INSTITUTO NACIONAL DE TECNOLOGÍA INDUSTRIAL   (Argentina)

^b INSTITUTO DE FÍSICA ROSARIO   (Argentina)

^c UNIVERSIDAD NACIONAL DE ROSARIO   (Argentina)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTER SIMULATION; CORRELATION METHODS; CURVE FITTING; FOURIER TRANSFORMS; WAVELET TRANSFORMS;

DENOISING; DIGITAL SPECKLE PATTERN INTERFEROMETRY (DSPI); SPECKLE NOISE; WEIGHTED SMOOTHING SPLINES;

INTERFEROMETRY;

EID: 19944384260     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.44.002728     Document Type: Article

References (20)

1. O. J. Løkberg, "Recent developments in video speckle interferometry," in Speckle Metrology, R. S. Sirohi, ed. (Marcel Dekker, New York, 1993), pp. 157-194.
2. N. K. Mohan and P. K. Rastogi, "Recent developments in digital speckle pattern interferometry," Opt. Lasers Eng. 40, 439-445 (2003).
3. J. M. Huntley, "Automated analysis of speckle interfero grams," in Digital Speckle Pattern Interferometry and Related Techniques, P. K. Rastogi, ed. (Wiley, Chichester, UK, 2001), pp. 59-139.
4. X. Colonna de Lega, "Continuous deformation measurement using dynamic phase-shifting and wavelet transform," in Applied Optics and Optoelectronics 1996, K. T. V. Grattan, ed. (Institute of Physics Publishing, Bristol, UK, 1996), pp. 261-267.
5. L. Watkins, S. Tan, and T. Barnes, "Determination of interferometer phase distributions by use of wavelets," Opt. Lett. 24, 905-907 (1999).
6. C. A. Sciammarella and T. Kim, "Determination of strains from fringe patterns using space-frequency representations," Opt. Eng. 42, 3182-3193 (2003).
7. A. Federico and G. H. Kaufmann, "Evaluation of the continuous wavelet transform method for the phase measurement of electronic speckle pattern interferometry fringes," Opt. Eng. 41, 3209-3216 (2002).
8. A. Federico and G. H. Kaufmann, "Phase retrieval in digital speckle pattern interferometry by use of a smoothed space-frequency distribution," Appl. Opt. 42, 7066-7071 (2003).
9. S. G. Chang, B. Yu, and M. Vetterli, "Spatially adaptive wavelet thresholding with context modeling for image denoising," IEEE Trans. Image Proc. 9, 1522-1531 (2000).
10. S. G. Chang, B. Yu, and M. Vetterli, "Adaptive wavelet thresholding for image denoising and compression," IEEE Trans. Image Proc. 9, 1532-1546 (2000).
11. A. Federico and G. H. Kaufmann, "Comparative study of wavelet thresholding methods for denoising electronic speckle pattern interferometry fringes," Opt. Eng. 40, 2598-2604 (2001).
12. Y. Qin, J. Chen, and H. Fan, "The study and application of a new filtering method on electronic speckle pattern interferometric fringes," Opt. Lasers Eng. 39, 449-456 (2003).
13. M. Unser, "Splines," IEEE Signal Process Mag. 16, 22-38 (1999).
14. N. Alcalá Ochoa, F. M. Santoyo, C. P. López, and B. Barrientos, "Multiplicative electronic speckle-pattern interferometry fringes," Appl. Opt. 39, 5138-5141 (2000).
15. D. I. Farrant, G. H. Kaufmann, J. N. Petzing, J. R. Tyrer, B. F. Oreb, and D. Kerr, "Measurement of transient deformations using dual-pulse addition ESPI," Appl. Opt. 37, 7259-7267 (1998).
16. C. de Boor, A Practical Guide to Splines (Springer-Verlag, Berlin, 1994).
17. C. de Boor, Department of Computer Sciences, University of Wisconsin-Madison, 1210 West Dayton Street, Madison, Wis. 53706-1685, "Calculation of the smoothing spline with weighted roughness measure." This paper can be downloaded at the Web site http://www.cs.wisc.edu.
18. J. A. Quiroga, J. Gómez-Pedrero, and A. García-Botella, "Algorithm for fringe pattern normalization," Opt. Commun. 197, 43-51 (2001).
19. Z. Wang and A. C. Bovik, "A universal quality index," IEEE Signal Process Lett. 9, 81-84 (2002).
20. G. H. Kaufmann, "Nondestructive testing with thermal waves using phase shifted temporal speckle pattern interferometry," Opt. Eng. 42, 2010-2014 (2003).