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Volumn 40, Issue 5-6, 2003, Pages 439-445

Recent developments in digital speckle pattern interferometry

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Indexed keywords


EID: 0038010478     PISSN: 01438166     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0143-8166(02)00139-2     Document Type: Editorial
Times cited : (46)

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