Effect of ferroelectric switching time on fatigue behaviors of (117)- and (00l)-oriented (Bi,La)4Ti3O12 thin films

Thin Solid Films

Volumn 484, Issue 1-2, 2005, Pages 374-378

  Yoon, Sung Min ^a   Lee, Nam Yeal ^a   Ryu, Sang Ouk ^a   Shin, Woong Chul ^a   You, In Kyu ^a   Yu, Byoung Gon ^a  

^a Electronics and Telecommunications Research Institute (ETRI)   (South Korea)

Author keywords

BLTO; Capacitors; Fatigue; Ferroelectric materials; Ferroelectric memory; Preferred orientation; Switching time; X ray diffraction

Indexed keywords

CAPACITORS; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; FATIGUE OF MATERIALS; FERROELECTRIC MATERIALS; REMANENCE; SWITCHING THEORY; TITANIUM COMPOUNDS; X RAY DIFFRACTION;

BLTO; FATIGUE; FERROELECTRIC MEMORY; PREFERRED ORIENTATION; SWITCHING TIME;

FERROELECTRIC THIN FILMS;

EID: 19944366289     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2005.03.004     Document Type: Article

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