An effective modern approach for measuring high-tech product manufacturing process quality

Journal of the Chinese Institute of Industrial Engineers

Volumn 22, Issue 2, 2005, Pages 119-133

  Pearn, W L ^a   Wu, Chien Wei ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Critical values; Fraction of nonconformities; Lower confidence bound; PPM; Process capability indices

Indexed keywords

CUSTOMER SATISFACTION; MICROELECTRONICS; NORMAL DISTRIBUTION; PROBABILITY; PROCESS CONTROL; PRODUCT DEVELOPMENT; QUALITY FUNCTION DEPLOYMENT;

CRITICAL VALUES; FRACTION OF NONCONFORMITIES; LOWER CONFIDENCE BOUND; PROCESS CAPABILITY INDICES;

MANUFACTURE;

EID: 19544391454     PISSN: 10170669     EISSN: 21517606     Source Type: Journal    
DOI: 10.1080/10170660509509283     Document Type: Article

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