Thermal property measurement of thin aluminum oxide layers for giant magnetoresistive (GMR) head applications

American Society of Mechanical Engineers, Electronic and Photonic Packaging, EPP

Volumn 3, Issue , 2003, Pages 855-860

  Behkam, Bahareh ^a   Yang, Yizhang ^a   Asheghi, Mehdi ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ELECTRIC BREAKDOWN OF SOLIDS; ELECTROSTATICS; FAILURE ANALYSIS; GIANT MAGNETORESISTANCE; MAGNETIC DISK STORAGE; MAGNETIC RECORDING; PARAMETER ESTIMATION; PASSIVATION; THERMAL CONDUCTIVITY OF SOLIDS; TRANSDUCERS;

ELECTROSTATIC DISCHARGES (ESD); RECORDING DENSITY;

THIN FILMS;

EID: 1942536081     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE2003-41626     Document Type: Conference Paper

References (16)

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