REGINA test mask: Research on EMC guidelines for integrated automotive circuits

Microelectronics Journal

Volumn 35, Issue 6 SPEC ISS., 2004, Pages 509-523

  Lochot, C ^a   Calvet, S ^a   Ben Dhia, S ^b   Sicard, E ^b  

^a MOTOROLA INC   (United States)

^b INSA   (France)

Author keywords

CMOS circuits; EMC for IC; EMI; Modeling; Parasitic emission; Radiated and Conducted measurements

Indexed keywords

CMOS INTEGRATED CIRCUITS; ELECTROMAGNETIC COMPATIBILITY; FAST FOURIER TRANSFORMS; MASKS; MICROELECTRONICS; PRINTED CIRCUIT BOARDS; SENSORS; SIGNAL INTERFERENCE;

EMC FOR IC; INTEGRATED CIRCUIT EMISSION MODELS (ICEM); PARASITIC EMISSIONS; RADIATE AND CONDUCTED MEASUREMENTS;

AUTOMOBILE ELECTRONIC EQUIPMENT;

EID: 1942535220     PISSN: 00262692     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mejo.2003.11.007     Document Type: Article

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