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Volumn 1, Issue , 2000, Pages 107-112
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Experimental characterization of switching noise and signal integrity in deep submicron integrated circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
ACOUSTIC NOISE;
ELECTROMAGNETIC COMPATIBILITY;
MAGNETOELECTRIC EFFECTS;
MICROPROCESSOR CHIPS;
SWITCHING;
ELECTROMAGNETIC EMISSIONS (EME);
SIGNAL INTEGRITY;
SUBMICRON INTEGRATED CIRCUITS;
INTEGRATED CIRCUIT TESTING;
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EID: 0033696250
PISSN: 01901494
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
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Times cited : (10)
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References (2)
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