Measuring the electric and magnetic near fields in VLSI devices

IEEE International Symposium on Electromagnetic Compatibility

Volumn 2, Issue , 1999, Pages 887-892

  Slattery, Kevin ^a   Cui, Wei ^b  

^a MIS International   (United States)

^b MISSOURI UNIVERSITY OF SCIENCE AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROMAGNETIC COMPATIBILITY; STEPPING MOTORS; DIGITAL DEVICES; ELECTRIC CURRENT DISTRIBUTION MEASUREMENT; ELECTRIC FIELD MEASUREMENT; MAGNETIC FIELD MEASUREMENT; MICROCOMPUTERS; OPTICAL DEVICES; PRINTED CIRCUIT BOARDS; PROBES; SCANNING; VLSI CIRCUITS;

CLOCK FREQUENCY; DATA POINTS; ELECTRIC AND MAGNETIC FIELDS; HIGH-FREQUENCY CURRENT; HIGHLY ACCURATE; MAGNETIC NEAR FIELD; SPATIAL RESOLUTION; STEPPER MOTOR;

VLSI CIRCUITS; ELECTROMAGNETIC COMPATIBILITY;

ELECTRIC FIELD PROBES; MAGNETIC FIELD PROBES; OPTICAL PRECISION STEPPER MOTORS;

EID: 0033334456     PISSN: 10774076     EISSN: 21581118     Source Type: Conference Proceeding    
DOI: 10.1109/ISEMC.1999.810172     Document Type: Conference Paper

References (2)

1. Microwave Scope Images Device Fields, Center for Superconductivity Research, University of Maryland, described in EE Times, February 1998.
2. Near Field Mapping above a Coupled-line Filter and a MMIC, T.P. Budka, et al. Microwave Journal Vol. 41, No. 3, March 1998.