XEUS wide-field imager: First experimental results with the X-ray active pixel sensor DEPFET

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5165, Issue , 2004, Pages 10-18

  Struder L ^a   Hasinger, G ^a   Holl, P ^b   Lechner, P ^b   Lutz, G ^c   Porro, M ^d   Richter, R ^c   Soltau, H ^b   Treis, J ^a  

^a MAX PLANCK INSTITUT FÜR EXTRATERRESTRISCHE PHYSIK   (Germany)

^b PNSENSOR GMBH   (Germany)

^c MAX PLANCK INSTITUT FÜR PHYSIK   (Germany)

^d POLITECNICO DI MILANO   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CHARGE COUPLED DEVICES; FIELD EFFECT TRANSISTORS; IMAGE SENSORS; RADIATION DETECTORS; SENSOR DATA FUSION; SPECTROMETERS; X RAYS;

MIRROR SPACECRAFT (MSC); X RAY EVOLVING UNIVERSE SPECTROSCOPY (XEUS);

ASTRONOMY;

EID: 1942519365     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.507148     Document Type: Conference Paper

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