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Volumn 377, Issue 2-3, 1996, Pages 381-386

Fast tools for 3-D design problems in semiconductor detectors

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; BOUNDARY CONDITIONS; CALCULATIONS; CAPACITANCE; DESIGN; ELECTRIC CURRENTS; ELECTRIC FIELDS; ELECTRODES; LAPLACE TRANSFORMS; SEMICONDUCTOR DEVICES; THREE DIMENSIONAL; TRAJECTORIES;

EID: 0030214029     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-9002(96)00020-4     Document Type: Article
Times cited : (10)

References (7)
  • 1
    • 0042041341 scopus 로고
    • Masson, Paris
    • E. Durand, Electrostatique, Vol. 1 (Masson, Paris, 1964) p. 236.
    • (1964) Electrostatique , vol.1 , pp. 236
    • Durand, E.1
  • 3
    • 0042542166 scopus 로고
    • Masson, Paris
    • E. Durand, Electrostatique, Vol. 1 (Masson, Paris, 1964) p. 243.
    • (1964) Electrostatique , vol.1 , pp. 243
    • Durand, E.1
  • 4
    • 0009806361 scopus 로고
    • HFIELDS: A highly flexible 2-D semiconductor-device analysis program
    • Dublin, Ireland, June 19-21
    • G. Baccarani, R. Guerrieri, P. Ciampolini and M. Rudan, HFIELDS: a highly flexible 2-D semiconductor-device analysis program, Nasecode IV, Dublin, Ireland, June 19-21, 1985.
    • (1985) Nasecode IV
    • Baccarani, G.1    Guerrieri, R.2    Ciampolini, P.3    Rudan, M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.